MODULAR MANUFACTURING TEST SYSTEM

A modular test platform with a wide selection of modules allows optimal configuration of test solutions for optical component and network systems manufacturing.

Yokogawa offers a wide lineup of modules including variable optical attenuators with or without built-in power meters, high power & multi channel power meters, high-stability laser sources and switches in a variety of channel counts.

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Created on: 29 October 2014

The AQ2200-215 is an optical power meter designed specifically to measure high optical power up to +30dBm. It features high speed sampling and advanced data processing functions.  The AQ2200-215 is an ideal measurement tool for optical output power measurement and margin test of WDM transmission equipment, as well as gain measurements of optical fiber amplifiers. It is commonly used in conjunction with other AQ2200 Series modules and the AQ6370C Optical Spectrum Analyzer to offer a flexible customized optical measurement system.

Created on: 29 October 2014

Compact: Optical switches of 1 x 4 or 1 x 8 port configuration in a one-slot size module Compatible with SMF (core diameter of 10 µm) or MMF (core diameter of 62.5 µm) Low insertion loss: 1.0 dB (typ.) High switching reproducibility: within ±0.01 dB Can be combined with various AQ2200 series modules or other Yokogawa's optical communication measuring instruments to build versatile measuring systems    DETAILS   HIGH-PERFORMANCE OPTICAL SWITCH   The AQ2200-411 OSW module is a space-saving optical switch featuring low insertion loss and superior switching reproducibility, and allows selection of 1 x 4 or 1 x 8 port configuration according to the application.Moreover, the optical fiber type can also be selected between SMF (core diameter of 10 µm) and MMF (core diameter of 62.5 µm), allowing a wide range of measuring systems to be built corresponding to the systems or devices used in optical public networks or optical LANs. EXAMPLES OF MEASUREMENT APPLICATION For measuring multiple objects, with switching of the object to be measured For measuring device characteristics, etc. by switching multiple measuring...

Created on: 29 October 2014

Compact: Optical switches of 1 x 16 port configuration in a two-slot size module Compatible with SMF (core diameter of 10 µm). MMF (core diameter of 50 or 62.5 µm) is also available on request. Low insertion loss: 1.0 dB (typ.) High switching reproducibility: within ±0.01 dB Can be combined with various AQ2200 series modules or other Yokogawa's optical communication measuring instruments to build versatile measuring systems

Created on: 29 October 2014

Compact: Optical switches of 1 x 2 or 2 x 2 port configuration in a one-slot size module Compatible with SMF (core diameter of 10 µm) or MMF (core diameter of 62.5 µm) Low insertion loss: 1.0 dB (typ.) High switching reproducibility: within ±0.01 dB Can be combined with various AQ2200 series modules or other Yokogawa's optical communication measuring instruments to build versatile measuring systems  

Created on: 29 October 2014

The AQ2200-642 reduces the complexity and cost of 10G optical transceiver testing by combining bus and power control features into the same mainframe that performs Signal Generation, BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver test, simplifying test setup, decreasing test time and increasing productivity. The wiring complexity and test bench size are reduced by replacing separate Digital Multi-Meters, Programmable Power supplies and Serial I/F controllers with a single module.

Created on: 29 October 2014

The AQ2200-651 Signal Generator module reduces the complexity and cost of 10G optical transceiver testing by combining Signal Generation functions into the same mainframe  that provides bus and power control while performing BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver  test, simplifying test setup, decreasing test time and increasing productivity.  The wiring complexity and test bench size are reduced by replacing up to 5 Signal Generators with a single module.