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Features:
※ Loop Test
※ Auto-Search
※ Seif-Diagnosis
※ Over-Load Protection
※ Measures 1800 Kinds of Device
※ 54/74 Series TTL
※ 4000 and 4500 Series CMOS
※ Test Socket: 28 Pin
Description:
Bench-Top Digital IC Tester.
The GUT-6000B is a desktop digital IC tester. Oriented toward automating testing tasks, the GUT-6000B contains high-end features such as auto-search and loop testing. Automated processes provide an intelligent and continuous process for detecting defective ICs. Self-diagnosis functions and over-load protection mechanisms make the GUT-6000A close to maintenance-free, releasing users from unnecessary hassles. The wide device coverage includes the 1800 series as well as the ubiquitous TTL and CMOS, providing a one-size fits-all solution for an IC testing bench area.
Specification:
| TEST RANGE | |
| 54/74 series TTL | |
| CMOS 40/45 | |
| DRIVE | |
| TEST VOLTAGE | |
| 2.5/3.0/3.3/5V | |
| TEST TIME | |
| Average Search Time: 0.6 Sec | |
| DISPLAY | |
| 16 Characters in 1 line LCD | |
| POWER SOURCE | |
| AC 100V~240V+10%, 50/60Hz | |
| DIMENSIONS & WEIGHT | |
| 335(W) x 105(H) x 300(D) mm Approx. 1.5kg |
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Accessories:
User manual x1, Power cord x1
Ordering Information:
GUT-6000B Digital IC Tester
Download:
Manual
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Description
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| 2002 K | GUT-6000B Product User Manual | en | V0 | 2012/5/2 |
Sales Kit
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Description
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| 675 K | GUT-6000B Product Information | en | V0 | 2012/5/2 |